Testing of object-oriented programs based on finite state machines

Hyoung Seok Hong, Yong Rae Kwon, Sungdeok Cha

Research output: Chapter in Book/Report/Conference proceedingConference contribution

36 Citations (Scopus)

Abstract

In object-oriented testing literature, a class is considered to be a basic unit of testing. A major characteristic of classes is the interaction between data members and member functions. This interaction is represented as definitions and uses of data members in member functions and can be properly modeled with finite state machines (FSM). We discuss how FSMs can be effectively used for class testing. We demonstrate how to specify the behavior of classes using FSMs and present a test case generation technique based on FSMs. In our technique, FSMs are transformed into a flow of the graph from which we can explicitly identify data flows of the FSM. Then we generate test cases using conventional data flow testing techniques upon the flow graph.

Original languageEnglish
Title of host publicationProceedings - 1995 Asia Pacific Software Engineering Conference, APSEC 1995
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages234-241
Number of pages8
ISBN (Electronic)0818671718, 9780818671715
DOIs
Publication statusPublished - 1995 Jan 1
Externally publishedYes
Event1995 Asia Pacific Software Engineering Conference, APSEC 1995 - Brisbane, Australia
Duration: 1995 Dec 61995 Dec 9

Publication series

NameProceedings - 1995 Asia Pacific Software Engineering Conference, APSEC 1995

Conference

Conference1995 Asia Pacific Software Engineering Conference, APSEC 1995
CountryAustralia
CityBrisbane
Period95/12/695/12/9

ASJC Scopus subject areas

  • Software
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Hong, H. S., Kwon, Y. R., & Cha, S. (1995). Testing of object-oriented programs based on finite state machines. In Proceedings - 1995 Asia Pacific Software Engineering Conference, APSEC 1995 (pp. 234-241). [496972] (Proceedings - 1995 Asia Pacific Software Engineering Conference, APSEC 1995). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/APSEC.1995.496972