The attachment of carbon nanotube on a blunt AFM tip using electric fields

Hyung Woo Lee, Soon Geun Kwon, Soo Hyun Kim, Yoon Keun Kwak, Chang Soo Han

Research output: Contribution to conferencePaper

Abstract

We report a simple, low cost, reliable technique of making carbon nanotube (CNT) modified atomic force microscopy (AFM) tip. We used the dielectrophoresis and the electrophoresis to align and deposit carbon nanotubes on the end of the AFM tip. From the simulation and the various experiments, we obtained the optimal electric condition, 0.32Vpp/μm. Also, we found that the blunt shape of the tip's apex is more effective than sharpened one. Through the experiments, we verified that the blunt shape is more effective over 50% than the sharpened one in the attachment of CNTs. By comparing the scanning results between the CNT modified tip and a normal AFM tip, we obtained the improvement in efficiency of 23%.

Original languageEnglish
Pages511-515
Number of pages5
DOIs
Publication statusPublished - 2004 Dec 1
Externally publishedYes
Event2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004 - Anaheim, CA, United States
Duration: 2004 Nov 132004 Nov 19

Other

Other2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004
CountryUnited States
CityAnaheim, CA
Period04/11/1304/11/19

Keywords

  • Atomic Force Microscopy (AFM)
  • Blunt tip
  • Carbon nanotube (CNT)
  • Dielectrophoresis
  • Electrophoresis

ASJC Scopus subject areas

  • Mechanical Engineering
  • Electrical and Electronic Engineering

Cite this

Lee, H. W., Kwon, S. G., Kim, S. H., Kwak, Y. K., & Han, C. S. (2004). The attachment of carbon nanotube on a blunt AFM tip using electric fields. 511-515. Paper presented at 2004 ASME International Mechanical Engineering Congress and Exposition, IMECE 2004, Anaheim, CA, United States. https://doi.org/10.1115/IMECE2004-61549