The behavior of mass flow rate of a Joule-Thomson refrigerator

Yong Ju Hong, Seong Je Park, Hyo Bong Kim, Young Don Choi

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Citations (Scopus)

Abstract

Cooling capacity and cool-down time of a Joule-Thomson (J-T) refrigerator depends on mass flow rates of refrigerants and their enthalpy changes. It is obvious that the mass flow rate through the J-T refrigerator depends on supply pressure; it increases as the supply pressure increases. Furthermore the mass flow rate increases as the temperature of the cold end decreases when the supply pressure does not change during the cool-down process. In this study, the cool-down characteristics of a miniature J-T refrigerator (fixed orifice / demand flow type) with different pressures of nitrogen and argon gas, were investigated by experiment. To analyze the cool-down characteristics of the refrigerator, the supply and exhaust pressure, the temperatures on the surface of the cryostat, and the mass flow rate were measured simultaneously. The results show the effect of the supply pressure on the performance of the refrigerator. The influence of the supply pressure and the temperature on the mass flow rate during the cool-down stage is discussed in detail.

Original languageEnglish
Title of host publicationAIP Conference Proceedings
Pages565-572
Number of pages8
Volume823 I
DOIs
Publication statusPublished - 2006 Apr 27
EventADVANCES IN CRYOGENIC ENGINEERING: Transactions of the Cryogenic Engineering Conference, CEC - Keystone, CO, United States
Duration: 2005 Aug 292005 Sep 2

Other

OtherADVANCES IN CRYOGENIC ENGINEERING: Transactions of the Cryogenic Engineering Conference, CEC
CountryUnited States
CityKeystone, CO
Period05/8/2905/9/2

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Keywords

  • Joule Thomson refrigerator
  • Mass flow rate

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Hong, Y. J., Park, S. J., Kim, H. B., & Choi, Y. D. (2006). The behavior of mass flow rate of a Joule-Thomson refrigerator. In AIP Conference Proceedings (Vol. 823 I, pp. 565-572) https://doi.org/10.1063/1.2202461