The chemical composition of a metal/ceramic interface on an atomic scale: The Cu/MgO {111} interface

Ho Jang, D. N. Seidman, K. L. Merkle

Research output: Contribution to journalArticle

49 Citations (Scopus)

Abstract

The chemical composition profile across a Cu/MgO {111}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atom-probe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222} MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {111}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence Cu|O|Mg... and not Cu|Mg|O...; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and <110>Cu // <110>MgO.

Original languageEnglish
Pages (from-to)61-75
Number of pages15
JournalInterface Science
Volume1
Issue number1
DOIs
Publication statusPublished - 1993 Mar 1
Externally publishedYes

Fingerprint

Cermets
Precipitates
precipitates
chemical composition
ceramics
matrices
Chemical analysis
metals
Internal oxidation
High resolution electron microscopy
Deconvolution
electron microscopy
Microscopic examination
spatial resolution
spacing
Ions
microscopy
Atoms
oxidation
probes

Keywords

  • atom-probe field-ion microscopy
  • Cu/MgO heterophase interface
  • high resolution electron microscopy
  • internal oxidation
  • Metal/ceramic interface

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials
  • Materials Science(all)

Cite this

The chemical composition of a metal/ceramic interface on an atomic scale : The Cu/MgO {111} interface. / Jang, Ho; Seidman, D. N.; Merkle, K. L.

In: Interface Science, Vol. 1, No. 1, 01.03.1993, p. 61-75.

Research output: Contribution to journalArticle

@article{077ba901158346f0bd85894c0c405375,
title = "The chemical composition of a metal/ceramic interface on an atomic scale: The Cu/MgO {111} interface",
abstract = "The chemical composition profile across a Cu/MgO {111}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atom-probe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222} MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {111}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence Cu|O|Mg... and not Cu|Mg|O...; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and <110>Cu // <110>MgO.",
keywords = "atom-probe field-ion microscopy, Cu/MgO heterophase interface, high resolution electron microscopy, internal oxidation, Metal/ceramic interface",
author = "Ho Jang and Seidman, {D. N.} and Merkle, {K. L.}",
year = "1993",
month = "3",
day = "1",
doi = "10.1007/BF00203266",
language = "English",
volume = "1",
pages = "61--75",
journal = "Journal of Materials Science",
issn = "0022-2461",
publisher = "Springer Netherlands",
number = "1",

}

TY - JOUR

T1 - The chemical composition of a metal/ceramic interface on an atomic scale

T2 - The Cu/MgO {111} interface

AU - Jang, Ho

AU - Seidman, D. N.

AU - Merkle, K. L.

PY - 1993/3/1

Y1 - 1993/3/1

N2 - The chemical composition profile across a Cu/MgO {111}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atom-probe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222} MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {111}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence Cu|O|Mg... and not Cu|Mg|O...; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and <110>Cu // <110>MgO.

AB - The chemical composition profile across a Cu/MgO {111}-type heterophase interface, produced by the internal oxidation of a Cu(Mg) single-phase alloy at 1173 K, is measured via atom-probe field-ion microscopy with a spatial resolution of 0.121 nm; this resolution is equal to the interplanar spacing of the {222} MgO planes. In particular, we demonstrate directly that the bonding across a Cu/MgO {111}-type heterophase interface, along a <111> direction common to both the Cu matrix and an MgO precipitate, has the sequence Cu|O|Mg... and not Cu|Mg|O...; this result is achieved without any deconvolution of the experimental data. Before determining this chemical sequence, it was established, via high-resolution electron microscopy, that the morphology of an MgO precipitate in a Cu matrix is an octahedron faceted on {111} planes with a cube-on-cube relationship between a precipitate and the matrix; that is, {111}Cu//{222}MgO and <110>Cu // <110>MgO.

KW - atom-probe field-ion microscopy

KW - Cu/MgO heterophase interface

KW - high resolution electron microscopy

KW - internal oxidation

KW - Metal/ceramic interface

UR - http://www.scopus.com/inward/record.url?scp=0002326103&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=0002326103&partnerID=8YFLogxK

U2 - 10.1007/BF00203266

DO - 10.1007/BF00203266

M3 - Article

AN - SCOPUS:0002326103

VL - 1

SP - 61

EP - 75

JO - Journal of Materials Science

JF - Journal of Materials Science

SN - 0022-2461

IS - 1

ER -