The degradation of multi-crystalline silicon solar cells after damp heat tests

Wonwook Oh, Seongtak Kim, Soohyun Bae, Nochang Park, Yoon Mook Kang, Haeseok Lee, Donghwan Kim

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

Lower performance of multi-crystalline silicon solar cells is usually observed after long-term damp heat test at 85 °C/85% relative humidity. Performance degradation is known to result from the loss in fill factor (FF) due to high series resistance. The causes of the increase in the series resistance are the reduction of the photovoltaic (PV) ribbon in the solder joint and the oxidation of surface on the front Ag finger by high thermal and moisture stress. Additionally, severe degradation by FF loss after damp heat originated from the contact resistance between Si and Ag fingers. Ag crystallites on Si wafer and bulk Ag at the edge of the Ag finger were partially oxidized and could not play a role in the current path of photo-generated electrons.

Original languageEnglish
Pages (from-to)2176-2179
Number of pages4
JournalMicroelectronics Reliability
Volume54
Issue number9-10
DOIs
Publication statusPublished - 2014 Jan 1

Fingerprint

high temperature tests
Silicon solar cells
solar cells
degradation
Crystalline materials
Degradation
Contact resistance
solders
thermal stresses
contact resistance
Crystallites
moisture
Soldering alloys
ribbons
crystallites
humidity
Atmospheric humidity
Moisture
wafers
heat

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Surfaces, Coatings and Films
  • Atomic and Molecular Physics, and Optics
  • Condensed Matter Physics
  • Safety, Risk, Reliability and Quality

Cite this

The degradation of multi-crystalline silicon solar cells after damp heat tests. / Oh, Wonwook; Kim, Seongtak; Bae, Soohyun; Park, Nochang; Kang, Yoon Mook; Lee, Haeseok; Kim, Donghwan.

In: Microelectronics Reliability, Vol. 54, No. 9-10, 01.01.2014, p. 2176-2179.

Research output: Contribution to journalArticle

Oh, Wonwook ; Kim, Seongtak ; Bae, Soohyun ; Park, Nochang ; Kang, Yoon Mook ; Lee, Haeseok ; Kim, Donghwan. / The degradation of multi-crystalline silicon solar cells after damp heat tests. In: Microelectronics Reliability. 2014 ; Vol. 54, No. 9-10. pp. 2176-2179.
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