The effect of annealing on amorphous indium gallium zinc oxide thin film transistors

H. S. Bae, J. H. Kwon, S. Chang, M. H. Chung, T. Y. Oh, J. H. Park, S. Y. Lee, B. K. Ju

Research output: Contribution to conferencePaperpeer-review

Fingerprint

Dive into the research topics of 'The effect of annealing on amorphous indium gallium zinc oxide thin film transistors'. Together they form a unique fingerprint.

Engineering & Materials Science

Chemical Compounds