The effect of frequency of electromagnetic vibration on the primary silicon size in hypereutectic Al-Si alloy

E. P. Yoon, J. P. Choi, J. P. Park, K. B. Kim, Wooyoung Yoon, M. H. Kim, Kwon Hee Kim, T. W. Nam

Research output: Contribution to journalArticle

Abstract

In this study, the electromagnetic vibration is adopted for control of the size of primary Si phase. The higher the current density and frequency of electromagnetic vibration (EMV), the finer the size of primary Si phase. The higher the current density but the lower frequency of EMV, the bigger the size of primary Si phase. This phenomenon considered to be related the collision, agglomeration and diffusion of silicon atoms.

Original languageEnglish
Pages (from-to)413-416
Number of pages4
JournalMaterials Science Forum
Volume475-479
Issue numberI
Publication statusPublished - 2005 Apr 25

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Keywords

  • Al-Si
  • Aluminum alloy
  • Electromagnetic force
  • Primary Silicon
  • Vibration

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Yoon, E. P., Choi, J. P., Park, J. P., Kim, K. B., Yoon, W., Kim, M. H., ... Nam, T. W. (2005). The effect of frequency of electromagnetic vibration on the primary silicon size in hypereutectic Al-Si alloy. Materials Science Forum, 475-479(I), 413-416.