The effect of frequency of electromagnetic vibration on the primary silicon size in hypereutectic Al-Si alloy

E. P. Yoon, J. P. Choi, J. P. Park, K. B. Kim, W. Y. Yoon, M. H. Kim, K. H. Kim, T. W. Nam

Research output: Contribution to journalConference article

Abstract

In this study, the electromagnetic vibration is adopted for control of the size of primary Si phase. The higher the current density and frequency of electromagnetic vibration (EMV), the finer the size of primary Si phase. The higher the current density but the lower frequency of EMV, the bigger the size of primary Si phase. This phenomenon considered to be related the collision, agglomeration and diffusion of silicon atoms.

Original languageEnglish
Pages (from-to)413-416
Number of pages4
JournalMaterials Science Forum
Volume475-479
Issue numberI
DOIs
Publication statusPublished - 2005
EventPRICM 5: The Fifth Pacific Rim International Conference on Advanced Materials and Processing - Beijing, China
Duration: 2004 Nov 22004 Nov 5

Keywords

  • Al-Si
  • Aluminum alloy
  • Electromagnetic force
  • Primary Silicon
  • Vibration

ASJC Scopus subject areas

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering

Fingerprint Dive into the research topics of 'The effect of frequency of electromagnetic vibration on the primary silicon size in hypereutectic Al-Si alloy'. Together they form a unique fingerprint.

  • Cite this