The effect of thermally induced stress on device temperature measurements by Raman spectroscopy

Jihyun Kim, J. A. Freitas, P. B. Klein, S. Jang, F. Ren, S. J. Pearton

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)

Fingerprint

Dive into the research topics of 'The effect of thermally induced stress on device temperature measurements by Raman spectroscopy'. Together they form a unique fingerprint.

Engineering & Materials Science

Physics & Astronomy

Chemical Compounds