The investigation of dielectric characteristics of (ba, sr)tio3 thin films in millimeter wavelength range

Chong-Yun Kang, S. F. Karmanenko, I. G. Mironenko, A. A. Semenov, A. I. Dedyk, A. A. Ivanov, P. Ju Beljavski, U. V. Pavlova

Research output: Contribution to journalArticle

1 Citation (Scopus)

Abstract

The microwave electrodeless measuring techniques for the determination of the characteristics of the ferroelectric (Ba, Sr)TiO3 thin films in the millimeter wavelength region were studied. The partialy filled cavity resonator based on the rectangular waveguide of Ka and V bands was theoretically and experimentally investigated. At the frequency around 90-100 GHz the technique of multiple signal reflections from the interface film/substrate was developed and implemented. As the result of microwave measurements of BST films the frequency dependence of dielectric loss factor was build up for the region 1-100 GHz, which had practically linear character.

Original languageEnglish
Pages (from-to)131-140
Number of pages10
JournalIntegrated Ferroelectrics
Volume86
Issue number1
DOIs
Publication statusPublished - 2006 Jan 1

Fingerprint

Microwave measurement
Thin films
Wavelength
Cavity resonators
Rectangular waveguides
Dielectric losses
thin films
wavelengths
signal reflection
Ferroelectric materials
microwaves
rectangular waveguides
Microwaves
cavity resonators
extremely high frequencies
dielectric loss
Substrates

Keywords

  • Cavity resonators
  • Dielectric loss factor
  • Ferroelectric BST films
  • Frequency dependence
  • Planar varactors
  • Sandwich topology

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Ceramics and Composites
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry
  • Condensed Matter Physics
  • Control and Systems Engineering

Cite this

Kang, C-Y., Karmanenko, S. F., Mironenko, I. G., Semenov, A. A., Dedyk, A. I., Ivanov, A. A., ... Pavlova, U. V. (2006). The investigation of dielectric characteristics of (ba, sr)tio3 thin films in millimeter wavelength range. Integrated Ferroelectrics, 86(1), 131-140. https://doi.org/10.1080/10584580601085271

The investigation of dielectric characteristics of (ba, sr)tio3 thin films in millimeter wavelength range. / Kang, Chong-Yun; Karmanenko, S. F.; Mironenko, I. G.; Semenov, A. A.; Dedyk, A. I.; Ivanov, A. A.; Beljavski, P. Ju; Pavlova, U. V.

In: Integrated Ferroelectrics, Vol. 86, No. 1, 01.01.2006, p. 131-140.

Research output: Contribution to journalArticle

Kang, C-Y, Karmanenko, SF, Mironenko, IG, Semenov, AA, Dedyk, AI, Ivanov, AA, Beljavski, PJ & Pavlova, UV 2006, 'The investigation of dielectric characteristics of (ba, sr)tio3 thin films in millimeter wavelength range', Integrated Ferroelectrics, vol. 86, no. 1, pp. 131-140. https://doi.org/10.1080/10584580601085271
Kang, Chong-Yun ; Karmanenko, S. F. ; Mironenko, I. G. ; Semenov, A. A. ; Dedyk, A. I. ; Ivanov, A. A. ; Beljavski, P. Ju ; Pavlova, U. V. / The investigation of dielectric characteristics of (ba, sr)tio3 thin films in millimeter wavelength range. In: Integrated Ferroelectrics. 2006 ; Vol. 86, No. 1. pp. 131-140.
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