Abstract
We propose a simple route to examine the thermoelectric characteristics of Si nanowires (NWs) with infrared (IR) images in air. A device platform is designed to investigate the reliability of the thermoelectric characteristics. The Seebeck coefficients of the Si NWs obtained from all the electrode-couples in the platform are nearly identical at about 140 lV/K, revealing the validity of the simple route. The directly measured Seebeck voltages are carefully compared with the sum of the individual Seebeck voltages, and the comparison is discussed in detail.
Original language | English |
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Pages (from-to) | 126-129 |
Number of pages | 4 |
Journal | Microelectronic Engineering |
Volume | 111 |
DOIs | |
Publication status | Published - 2013 |
Keywords
- Heat transfer
- Infrared image
- P-Type Si nanowires
- Plastic
- Thermoelectric
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering