Abstract
The use of thermoelectric lead telluride thin film for superresolution optical data storage is discussed. When exposed to the pulsed red light, the thermoelectric material shows positive and complete reversible change of optical transmittance. The Thermo-optic characterization of the Pb-Te thin film material was done with three-layers sample of 15 nm thick PbTe films sandwitched with ZnS-silica layer. The result shows that lead telluride shows a high SR readout capability and durability against repeated laser heating.
| Original language | English |
|---|---|
| Pages (from-to) | 2782-2784 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 85 |
| Issue number | 14 |
| DOIs | |
| Publication status | Published - 2004 Oct 4 |
Fingerprint
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
Cite this
Thermoelectric PbTe thin film for superresolution optical data storage. / Lee, Hyun Seok; Cheong, Byung Ki; Lee, Taek Sung; Lee, Kyeong Seok; Kim, Won Mok; Lee, Jae Won; Cho, Sung Ho; Huh, Joo Youl.
In: Applied Physics Letters, Vol. 85, No. 14, 04.10.2004, p. 2782-2784.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Thermoelectric PbTe thin film for superresolution optical data storage
AU - Lee, Hyun Seok
AU - Cheong, Byung Ki
AU - Lee, Taek Sung
AU - Lee, Kyeong Seok
AU - Kim, Won Mok
AU - Lee, Jae Won
AU - Cho, Sung Ho
AU - Huh, Joo Youl
PY - 2004/10/4
Y1 - 2004/10/4
N2 - The use of thermoelectric lead telluride thin film for superresolution optical data storage is discussed. When exposed to the pulsed red light, the thermoelectric material shows positive and complete reversible change of optical transmittance. The Thermo-optic characterization of the Pb-Te thin film material was done with three-layers sample of 15 nm thick PbTe films sandwitched with ZnS-silica layer. The result shows that lead telluride shows a high SR readout capability and durability against repeated laser heating.
AB - The use of thermoelectric lead telluride thin film for superresolution optical data storage is discussed. When exposed to the pulsed red light, the thermoelectric material shows positive and complete reversible change of optical transmittance. The Thermo-optic characterization of the Pb-Te thin film material was done with three-layers sample of 15 nm thick PbTe films sandwitched with ZnS-silica layer. The result shows that lead telluride shows a high SR readout capability and durability against repeated laser heating.
UR - http://www.scopus.com/inward/record.url?scp=8344272902&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=8344272902&partnerID=8YFLogxK
U2 - 10.1063/1.1801684
DO - 10.1063/1.1801684
M3 - Article
AN - SCOPUS:8344272902
VL - 85
SP - 2782
EP - 2784
JO - Applied Physics Letters
JF - Applied Physics Letters
SN - 0003-6951
IS - 14
ER -