Abstract
The use of thermoelectric lead telluride thin film for superresolution optical data storage is discussed. When exposed to the pulsed red light, the thermoelectric material shows positive and complete reversible change of optical transmittance. The Thermo-optic characterization of the Pb-Te thin film material was done with three-layers sample of 15 nm thick PbTe films sandwitched with ZnS-silica layer. The result shows that lead telluride shows a high SR readout capability and durability against repeated laser heating.
| Original language | English |
|---|---|
| Pages (from-to) | 2782-2784 |
| Number of pages | 3 |
| Journal | Applied Physics Letters |
| Volume | 85 |
| Issue number | 14 |
| DOIs | |
| Publication status | Published - 2004 Oct 4 |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)
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Lee, H. S., Cheong, B. K., Lee, T. S., Lee, K. S., Kim, W. M., Lee, J. W., Cho, S. H., & Huh, J. Y. (2004). Thermoelectric PbTe thin film for superresolution optical data storage. Applied Physics Letters, 85(14), 2782-2784. https://doi.org/10.1063/1.1801684