Thermopower profiling of a silicon p-n junction

Kyeongtae Kim, Jisang Park, Sun Ung Kim, Oh Myoung Kwon, Joon Sik Lee, Seungho Ho Park, Young Ki Choi

Research output: Contribution to journalArticle

8 Citations (Scopus)

Abstract

An ac type thermopower measurement technique was suggested and demonstrated with a simple experimental setup. The thermopower distribution across a silicon p-n junction was measured point by point at every 10 nm, so that it was free from the noise due to the built-in potential and photoionization effects, and it was compared with the theoretical result. Although this ac type thermopower measurement technique could not follow the sharp variation of the theoretical thermopower near the p-n junction, it could identify a smooth peak of the thermopower distribution in the depletion layer of the p-n junction.

Original languageEnglish
Article number043107
JournalApplied Physics Letters
Volume90
Issue number4
DOIs
Publication statusPublished - 2007 Feb 5

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p-n junctions
silicon
photoionization
depletion

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Kim, K., Park, J., Kim, S. U., Kwon, O. M., Lee, J. S., Park, S. H., & Choi, Y. K. (2007). Thermopower profiling of a silicon p-n junction. Applied Physics Letters, 90(4), [043107]. https://doi.org/10.1063/1.2432949

Thermopower profiling of a silicon p-n junction. / Kim, Kyeongtae; Park, Jisang; Kim, Sun Ung; Kwon, Oh Myoung; Lee, Joon Sik; Park, Seungho Ho; Choi, Young Ki.

In: Applied Physics Letters, Vol. 90, No. 4, 043107, 05.02.2007.

Research output: Contribution to journalArticle

Kim, K, Park, J, Kim, SU, Kwon, OM, Lee, JS, Park, SH & Choi, YK 2007, 'Thermopower profiling of a silicon p-n junction', Applied Physics Letters, vol. 90, no. 4, 043107. https://doi.org/10.1063/1.2432949
Kim K, Park J, Kim SU, Kwon OM, Lee JS, Park SH et al. Thermopower profiling of a silicon p-n junction. Applied Physics Letters. 2007 Feb 5;90(4). 043107. https://doi.org/10.1063/1.2432949
Kim, Kyeongtae ; Park, Jisang ; Kim, Sun Ung ; Kwon, Oh Myoung ; Lee, Joon Sik ; Park, Seungho Ho ; Choi, Young Ki. / Thermopower profiling of a silicon p-n junction. In: Applied Physics Letters. 2007 ; Vol. 90, No. 4.
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