Thickness-Dependent Electrocaloric Effect in Pb0.9La0.1Zr0.65Ti0.35O3 Films Grown by Sol–Gel Process

Im Jun Roh, Beomjin Kwon, Seung Hyub Baek, Seong Keun Kim, Jin Sang Kim, Chong-Yun Kang

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

Unlike bulk materials, many physical properties of thin-film materials depend on film thickness due to extrinsic effects such as residual stress and the dead layer. In this work, the effect of thickness on the electrocaloric properties of Pb0.9La0.1(Zr0.65Ti0.35)O3(10/65/35) (PLZT) films grown by the sol–gel method was studied experimentally. In the sol–gel synthesis, the annealing process results in residual stress and the metal–dielectric contact generates a dead layer. These extrinsic effects influence the dielectric and ferroelectric properties of the thin films, and their roles are film thickness dependent. For PLZT of nanometer thickness (from 420 nm to 1080 nm), the permittivity and polarization, and their temperature dependences, showed strong dependence on film thickness. In particular, in the temperature range from 70°C to 350°C, the electrocaloric temperature change showed threefold improvement (from 0.2°C to 0.6°C) as the thickness was increased from 420 nm to 840 nm. This work will aid development of polycrystalline thin films including PLZT for electrocaloric applications.

Original languageEnglish
Pages (from-to)1057-1064
Number of pages8
JournalJournal of Electronic Materials
Volume45
Issue number2
DOIs
Publication statusPublished - 2016 Feb 1

Fingerprint

Film thickness
film thickness
Thin films
residual stress
Residual stresses
thin films
Temperature
Ferroelectric materials
dielectric properties
Permittivity
Physical properties
physical properties
Annealing
Polarization
permittivity
temperature dependence
annealing
temperature
polarization
synthesis

Keywords

  • dead layer
  • Electrocaloric effect
  • PLZT
  • residual stress
  • thickness effect

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Materials Chemistry

Cite this

Thickness-Dependent Electrocaloric Effect in Pb0.9La0.1Zr0.65Ti0.35O3 Films Grown by Sol–Gel Process. / Roh, Im Jun; Kwon, Beomjin; Baek, Seung Hyub; Kim, Seong Keun; Kim, Jin Sang; Kang, Chong-Yun.

In: Journal of Electronic Materials, Vol. 45, No. 2, 01.02.2016, p. 1057-1064.

Research output: Contribution to journalArticle

Roh, Im Jun ; Kwon, Beomjin ; Baek, Seung Hyub ; Kim, Seong Keun ; Kim, Jin Sang ; Kang, Chong-Yun. / Thickness-Dependent Electrocaloric Effect in Pb0.9La0.1Zr0.65Ti0.35O3 Films Grown by Sol–Gel Process. In: Journal of Electronic Materials. 2016 ; Vol. 45, No. 2. pp. 1057-1064.
@article{9627b8a4fc244996a6a272e4e218544d,
title = "Thickness-Dependent Electrocaloric Effect in Pb0.9La0.1Zr0.65Ti0.35O3 Films Grown by Sol–Gel Process",
abstract = "Unlike bulk materials, many physical properties of thin-film materials depend on film thickness due to extrinsic effects such as residual stress and the dead layer. In this work, the effect of thickness on the electrocaloric properties of Pb0.9La0.1(Zr0.65Ti0.35)O3(10/65/35) (PLZT) films grown by the sol–gel method was studied experimentally. In the sol–gel synthesis, the annealing process results in residual stress and the metal–dielectric contact generates a dead layer. These extrinsic effects influence the dielectric and ferroelectric properties of the thin films, and their roles are film thickness dependent. For PLZT of nanometer thickness (from 420 nm to 1080 nm), the permittivity and polarization, and their temperature dependences, showed strong dependence on film thickness. In particular, in the temperature range from 70°C to 350°C, the electrocaloric temperature change showed threefold improvement (from 0.2°C to 0.6°C) as the thickness was increased from 420 nm to 840 nm. This work will aid development of polycrystalline thin films including PLZT for electrocaloric applications.",
keywords = "dead layer, Electrocaloric effect, PLZT, residual stress, thickness effect",
author = "Roh, {Im Jun} and Beomjin Kwon and Baek, {Seung Hyub} and Kim, {Seong Keun} and Kim, {Jin Sang} and Chong-Yun Kang",
year = "2016",
month = "2",
day = "1",
doi = "10.1007/s11664-015-4285-4",
language = "English",
volume = "45",
pages = "1057--1064",
journal = "Journal of Electronic Materials",
issn = "0361-5235",
publisher = "Springer New York",
number = "2",

}

TY - JOUR

T1 - Thickness-Dependent Electrocaloric Effect in Pb0.9La0.1Zr0.65Ti0.35O3 Films Grown by Sol–Gel Process

AU - Roh, Im Jun

AU - Kwon, Beomjin

AU - Baek, Seung Hyub

AU - Kim, Seong Keun

AU - Kim, Jin Sang

AU - Kang, Chong-Yun

PY - 2016/2/1

Y1 - 2016/2/1

N2 - Unlike bulk materials, many physical properties of thin-film materials depend on film thickness due to extrinsic effects such as residual stress and the dead layer. In this work, the effect of thickness on the electrocaloric properties of Pb0.9La0.1(Zr0.65Ti0.35)O3(10/65/35) (PLZT) films grown by the sol–gel method was studied experimentally. In the sol–gel synthesis, the annealing process results in residual stress and the metal–dielectric contact generates a dead layer. These extrinsic effects influence the dielectric and ferroelectric properties of the thin films, and their roles are film thickness dependent. For PLZT of nanometer thickness (from 420 nm to 1080 nm), the permittivity and polarization, and their temperature dependences, showed strong dependence on film thickness. In particular, in the temperature range from 70°C to 350°C, the electrocaloric temperature change showed threefold improvement (from 0.2°C to 0.6°C) as the thickness was increased from 420 nm to 840 nm. This work will aid development of polycrystalline thin films including PLZT for electrocaloric applications.

AB - Unlike bulk materials, many physical properties of thin-film materials depend on film thickness due to extrinsic effects such as residual stress and the dead layer. In this work, the effect of thickness on the electrocaloric properties of Pb0.9La0.1(Zr0.65Ti0.35)O3(10/65/35) (PLZT) films grown by the sol–gel method was studied experimentally. In the sol–gel synthesis, the annealing process results in residual stress and the metal–dielectric contact generates a dead layer. These extrinsic effects influence the dielectric and ferroelectric properties of the thin films, and their roles are film thickness dependent. For PLZT of nanometer thickness (from 420 nm to 1080 nm), the permittivity and polarization, and their temperature dependences, showed strong dependence on film thickness. In particular, in the temperature range from 70°C to 350°C, the electrocaloric temperature change showed threefold improvement (from 0.2°C to 0.6°C) as the thickness was increased from 420 nm to 840 nm. This work will aid development of polycrystalline thin films including PLZT for electrocaloric applications.

KW - dead layer

KW - Electrocaloric effect

KW - PLZT

KW - residual stress

KW - thickness effect

UR - http://www.scopus.com/inward/record.url?scp=84953368121&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84953368121&partnerID=8YFLogxK

U2 - 10.1007/s11664-015-4285-4

DO - 10.1007/s11664-015-4285-4

M3 - Article

AN - SCOPUS:84953368121

VL - 45

SP - 1057

EP - 1064

JO - Journal of Electronic Materials

JF - Journal of Electronic Materials

SN - 0361-5235

IS - 2

ER -