Thickness-dependent electron mobility of single and few-layer MoS2 thin-film transistors

Ji Heon Kim, Tae Ho Kim, Hyunjea Lee, Young Ran Park, Woong Choi, Cheol Jin Lee

Research output: Contribution to journalArticlepeer-review

30 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Thickness-dependent electron mobility of single and few-layer MoS<sub>2</sub> thin-film transistors'. Together they form a unique fingerprint.

Physics & Astronomy