Third-order nonlinear dynamic model for electrical characterization of organic light-emitting diodes

Mun Chae Yoon, Gyu-Tae Kim, Tae Woong Yoon

Research output: Contribution to journalArticle

Abstract

A third-order nonlinear model for organic light emitting diodes (OLEDs) is presented. The model can consistently describe dynamic and static characteristics of OLEDs. The model can also be used to estimate the physical characteristics of specific layers of an OLED. The parameters of the proposed model are estimated using a trust-region algorithm and a particle swarm optimization algorithm. Several of the resulting parameters relate to the electrical and light emission characteristics of OLEDs. Using only one set of experiments on an OLED device, a nonlinear model including all parameters, can be obtained; this method is highly advantageous for the fast quality control of OLEDs.

Original languageEnglish
Pages (from-to)1503-1508
Number of pages6
JournalJournal of Electrical Engineering and Technology
Volume11
Issue number5
DOIs
Publication statusPublished - 2016 Sep 1

Fingerprint

Organic light emitting diodes (OLED)
Dynamic models
Light emission
Particle swarm optimization (PSO)
Quality control
Experiments

Keywords

  • Nondestructive testing
  • Organic light-emitting diodes
  • System identification

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

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AB - A third-order nonlinear model for organic light emitting diodes (OLEDs) is presented. The model can consistently describe dynamic and static characteristics of OLEDs. The model can also be used to estimate the physical characteristics of specific layers of an OLED. The parameters of the proposed model are estimated using a trust-region algorithm and a particle swarm optimization algorithm. Several of the resulting parameters relate to the electrical and light emission characteristics of OLEDs. Using only one set of experiments on an OLED device, a nonlinear model including all parameters, can be obtained; this method is highly advantageous for the fast quality control of OLEDs.

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