Transport properties of magnetic tunnel junctions comprising NiFeSiB/CoFeB hybrid free layers

Ji Ung Cho, Do Kyun Kim, Reasmey P. Tan, Shinji Isogami, Masakiyo Tsunoda, Migaku Takahashi, Young-geun Kim

Research output: Contribution to journalArticle

4 Citations (Scopus)

Abstract

We report on the magneto-transport measurements of MgO magnetic tunnel junctions (MTJs) composed of NiFeSiB/CoFeB as the free layer for two different structures (top-type and bottom-type pinning). The magneto-transport properties of these MTJs were investigated by varying the thickness of the amorphous NiFeSiB layer for a fixed CoFeB thickness. The tunnel magnetoresistance (TMR), measured in both type of structures, exhibit the same or a higher amplitude (up to 230% measured at room temperature in the case of top-type device), comparing to the case of a single CoFeB free layer. These results suggest that hybrids free layers can be used as good candidates for MTJs with reduced saturation magnetization while keeping a high TMR ratio.

Original languageEnglish
Article number4957806
Pages (from-to)2364-2366
Number of pages3
JournalIEEE Transactions on Magnetics
Volume45
Issue number6
DOIs
Publication statusPublished - 2009 Jun 1

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Tunnel junctions
Transport properties
Magnetoresistance
Tunnels
Saturation magnetization
Temperature

Keywords

  • Amorphous
  • Hybrid free layer
  • Magnetic tunnel junction
  • NiFeSiB

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials

Cite this

Cho, J. U., Kim, D. K., Tan, R. P., Isogami, S., Tsunoda, M., Takahashi, M., & Kim, Y. (2009). Transport properties of magnetic tunnel junctions comprising NiFeSiB/CoFeB hybrid free layers. IEEE Transactions on Magnetics, 45(6), 2364-2366. [4957806]. https://doi.org/10.1109/TMAG.2009.2018574

Transport properties of magnetic tunnel junctions comprising NiFeSiB/CoFeB hybrid free layers. / Cho, Ji Ung; Kim, Do Kyun; Tan, Reasmey P.; Isogami, Shinji; Tsunoda, Masakiyo; Takahashi, Migaku; Kim, Young-geun.

In: IEEE Transactions on Magnetics, Vol. 45, No. 6, 4957806, 01.06.2009, p. 2364-2366.

Research output: Contribution to journalArticle

Cho, JU, Kim, DK, Tan, RP, Isogami, S, Tsunoda, M, Takahashi, M & Kim, Y 2009, 'Transport properties of magnetic tunnel junctions comprising NiFeSiB/CoFeB hybrid free layers', IEEE Transactions on Magnetics, vol. 45, no. 6, 4957806, pp. 2364-2366. https://doi.org/10.1109/TMAG.2009.2018574
Cho, Ji Ung ; Kim, Do Kyun ; Tan, Reasmey P. ; Isogami, Shinji ; Tsunoda, Masakiyo ; Takahashi, Migaku ; Kim, Young-geun. / Transport properties of magnetic tunnel junctions comprising NiFeSiB/CoFeB hybrid free layers. In: IEEE Transactions on Magnetics. 2009 ; Vol. 45, No. 6. pp. 2364-2366.
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