Tunneling magnetoresistance and magnetization switching of CoFeSiB free layered magnetic tunnel junctions

J. Y. Hwang, S. S. Kim, M. Y. Kim, J. R. Rhee, B. S. Chun, Young-geun Kim, T. W. Kim, S. S. Lee, D. G. Hwang

Research output: Contribution to journalArticle

Abstract

To reduce magnetization switching field (Hsw) of submicrometer-sized magnetic tunnel junctions (MTJs), amorphous ferromagnetic Co70.5Fe4.5Si15B10 free layered MTJs were studied and compared to Co75Fe25 and Ni80Fe20 free layered MTJs. As a CoFeSiB film has a low saturation magnetization ( Ms = 560 emu / cm3) and a high anisotropy constant ( Ku = 2800 erg / cm3), although CoFeSiB free layered MTJs had a slightly lower tunneling magnetoresistance (TMR) ratio than that of CoFe free layered MTJ, the MTJs exhibited much lower Hsw than that of CoFe free layered MTJ, and higher sensitivity than that of CoFe and NiFe free layered MTJs. Results of micromagnetic simulation on magnetization switching processes confirmed that the magnetization in CoFeSiB free layered MTJ switched almost uniformly. Moreover, the surface roughness became more uniform and breakdown voltage increased by inserting CoFeSiB into free layer. The CoFeSiB free layered MTJ structures were found to be beneficial for the switching characteristics such as reducing Hsw and increasing the sensitivity in micrometer-sized elements.

Original languageEnglish
JournalJournal of Magnetism and Magnetic Materials
Volume303
Issue number2 SPEC. ISS.
DOIs
Publication statusPublished - 2006 Aug 1

Fingerprint

Tunnelling magnetoresistance
Tunnel junctions
tunnel junctions
Magnetization
magnetization
sensitivity
Saturation magnetization
Electric breakdown
electrical faults
micrometers
surface roughness
Anisotropy
Surface roughness

Keywords

  • CoFeSiB
  • Magnetic tunnel junction
  • Magnetization switching
  • Switching field
  • Tunneling magnetoresistance

ASJC Scopus subject areas

  • Condensed Matter Physics

Cite this

Tunneling magnetoresistance and magnetization switching of CoFeSiB free layered magnetic tunnel junctions. / Hwang, J. Y.; Kim, S. S.; Kim, M. Y.; Rhee, J. R.; Chun, B. S.; Kim, Young-geun; Kim, T. W.; Lee, S. S.; Hwang, D. G.

In: Journal of Magnetism and Magnetic Materials, Vol. 303, No. 2 SPEC. ISS., 01.08.2006.

Research output: Contribution to journalArticle

Hwang, J. Y. ; Kim, S. S. ; Kim, M. Y. ; Rhee, J. R. ; Chun, B. S. ; Kim, Young-geun ; Kim, T. W. ; Lee, S. S. ; Hwang, D. G. / Tunneling magnetoresistance and magnetization switching of CoFeSiB free layered magnetic tunnel junctions. In: Journal of Magnetism and Magnetic Materials. 2006 ; Vol. 303, No. 2 SPEC. ISS.
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AU - Rhee, J. R.

AU - Chun, B. S.

AU - Kim, Young-geun

AU - Kim, T. W.

AU - Lee, S. S.

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