Abstract
This paper presents experimental and analytical studies on the characteristic resistance of NI (no-insulation) ReBCO pancake coils, which are used in an equivalent circuit model to characterize 'radial as well as spiral' current paths within the NI coils. We identified turn-to-turn contact resistance as a major source of the characteristic resistance of an NI coil. In order to verify this, three single pancake NI HTS coils - 60, 40, 20 turns - were fabricated with their winding tension carefully maintained constant. A sudden discharge test was performed on each coil to obtain its characteristic resistance, and the relation between the turn-to-turn contact and the characteristic resistance was investigated. Based on the characteristic resistance and the n-value model, an equivalent circuit model was proposed to characterize the time-varying response of the NI coils. Charging tests were performed on the three test coils and the experimental results were compared with the simulated ones to validate the proposed approach with the equivalent circuit model.
| Original language | English |
|---|---|
| Article number | 035012 |
| Journal | Superconductor Science and Technology |
| Volume | 26 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2013 Mar 1 |
Fingerprint
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Condensed Matter Physics
- Ceramics and Composites
- Materials Chemistry
- Metals and Alloys
Cite this
Turn-to-turn contact characteristics for an equivalent circuit model of no-insulation ReBCO pancake coil. / Wang, Xudong; Hahn, Seungyong; Kim, Youngjae; Bascuñán, Juan; Voccio, John; Lee, Haigun; Iwasa, Yukikazu.
In: Superconductor Science and Technology, Vol. 26, No. 3, 035012, 01.03.2013.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Turn-to-turn contact characteristics for an equivalent circuit model of no-insulation ReBCO pancake coil
AU - Wang, Xudong
AU - Hahn, Seungyong
AU - Kim, Youngjae
AU - Bascuñán, Juan
AU - Voccio, John
AU - Lee, Haigun
AU - Iwasa, Yukikazu
PY - 2013/3/1
Y1 - 2013/3/1
N2 - This paper presents experimental and analytical studies on the characteristic resistance of NI (no-insulation) ReBCO pancake coils, which are used in an equivalent circuit model to characterize 'radial as well as spiral' current paths within the NI coils. We identified turn-to-turn contact resistance as a major source of the characteristic resistance of an NI coil. In order to verify this, three single pancake NI HTS coils - 60, 40, 20 turns - were fabricated with their winding tension carefully maintained constant. A sudden discharge test was performed on each coil to obtain its characteristic resistance, and the relation between the turn-to-turn contact and the characteristic resistance was investigated. Based on the characteristic resistance and the n-value model, an equivalent circuit model was proposed to characterize the time-varying response of the NI coils. Charging tests were performed on the three test coils and the experimental results were compared with the simulated ones to validate the proposed approach with the equivalent circuit model.
AB - This paper presents experimental and analytical studies on the characteristic resistance of NI (no-insulation) ReBCO pancake coils, which are used in an equivalent circuit model to characterize 'radial as well as spiral' current paths within the NI coils. We identified turn-to-turn contact resistance as a major source of the characteristic resistance of an NI coil. In order to verify this, three single pancake NI HTS coils - 60, 40, 20 turns - were fabricated with their winding tension carefully maintained constant. A sudden discharge test was performed on each coil to obtain its characteristic resistance, and the relation between the turn-to-turn contact and the characteristic resistance was investigated. Based on the characteristic resistance and the n-value model, an equivalent circuit model was proposed to characterize the time-varying response of the NI coils. Charging tests were performed on the three test coils and the experimental results were compared with the simulated ones to validate the proposed approach with the equivalent circuit model.
UR - http://www.scopus.com/inward/record.url?scp=84873888124&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=84873888124&partnerID=8YFLogxK
U2 - 10.1088/0953-2048/26/3/035012
DO - 10.1088/0953-2048/26/3/035012
M3 - Article
AN - SCOPUS:84873888124
VL - 26
JO - Superconductor Science and Technology
JF - Superconductor Science and Technology
SN - 0953-2048
IS - 3
M1 - 035012
ER -