Two-frequency interferometer for a displacement measurement

Sin Hyuk Yim, Donghyun Cho, Jouyon Park

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We report on the construction of a two-frequency Michelson interferometer to measure small displacements based on the heterodyne principle. Unlike the common single-frequency interferometer, where relative displacements produce changes in output power, in the two-frequency device, displacements lead to phase shifts of the beating signal. The short- and long-term performance of the single- and two-frequency methods are compared. The heterodyne apparatus was also used to calibrate a piezoelectric transducer.

Original languageEnglish
Pages (from-to)153-156
Number of pages4
JournalAmerican Journal of Physics
Volume81
Issue number2
DOIs
Publication statusPublished - 2013 Jan 22

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displacement measurement
interferometers
piezoelectric transducers
Michelson interferometers
phase shift
output

ASJC Scopus subject areas

  • Physics and Astronomy(all)

Cite this

Two-frequency interferometer for a displacement measurement. / Hyuk Yim, Sin; Cho, Donghyun; Park, Jouyon.

In: American Journal of Physics, Vol. 81, No. 2, 22.01.2013, p. 153-156.

Research output: Contribution to journalArticle

Hyuk Yim, Sin ; Cho, Donghyun ; Park, Jouyon. / Two-frequency interferometer for a displacement measurement. In: American Journal of Physics. 2013 ; Vol. 81, No. 2. pp. 153-156.
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