Two-frequency interferometer for a displacement measurement

Sin Hyuk Yim, D. Cho, Jouyon Park

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

We report on the construction of a two-frequency Michelson interferometer to measure small displacements based on the heterodyne principle. Unlike the common single-frequency interferometer, where relative displacements produce changes in output power, in the two-frequency device, displacements lead to phase shifts of the beating signal. The short- and long-term performance of the single- and two-frequency methods are compared. The heterodyne apparatus was also used to calibrate a piezoelectric transducer.

Original languageEnglish
Pages (from-to)153-156
Number of pages4
JournalAmerican Journal of Physics
Volume81
Issue number2
DOIs
Publication statusPublished - 2013 Jan 22

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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