Two-Step Gamut Mapping for Optical See-Through Displays

Kang Kyu Lee, Jae Woo Kim, Je Ho Ryu, Jong-Ok Kim

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In Optical See-Through (OST) displays, the chroma component in color space is often distorted. OST displays appear to have a uniquely different gamut feature compared with conventional color devices. In this paper, we proposed a novel two-step gamut mapping method for OST displays. The conventional CARISMA (Color Appearance Research for Interactive System Management and Application) algorithm is extended straightforwardly, and its process is divided into two separate steps (lightness mapping and chroma compression) by reflecting the characteristics of the newtype OST. We confirmed experimentally that the proposed gamut mapping method can reduce color distortion better than the existing CARISMA.

Original languageEnglish
Title of host publicationAdjunct Proceedings of the 2017 IEEE International Symposium on Mixed and Augmented Reality, ISMAR-Adjunct 2017
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages130-131
Number of pages2
ISBN (Electronic)9780769563275
DOIs
Publication statusPublished - 2017 Oct 27
Event16th Adjunct IEEE International Symposium on Mixed and Augmented Reality, ISMAR-Adjunct 2017 - Nantes, France
Duration: 2017 Oct 92017 Oct 13

Other

Other16th Adjunct IEEE International Symposium on Mixed and Augmented Reality, ISMAR-Adjunct 2017
CountryFrance
CityNantes
Period17/10/917/10/13

Keywords

  • Chroma reproduction
  • Color distortion
  • Gamut mapping
  • Lightness mapping
  • OST display

ASJC Scopus subject areas

  • Human-Computer Interaction
  • Media Technology
  • Computer Science Applications

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  • Cite this

    Lee, K. K., Kim, J. W., Ryu, J. H., & Kim, J-O. (2017). Two-Step Gamut Mapping for Optical See-Through Displays. In Adjunct Proceedings of the 2017 IEEE International Symposium on Mixed and Augmented Reality, ISMAR-Adjunct 2017 (pp. 130-131). [8088464] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/ISMAR-Adjunct.2017.47