Abstract
We fabricated point-contacted a-Si:H(p)/c-Si(n) heterojunction solar cells using patterned SiO2 and investigated their electrical properties using the light current-voltage (I-V) curve and Suns-Voc measurements. The light I-V curves showed bias-dependent changes according to the applied voltage in the point-contacted cells, especially in the samples with a long distance between the point-contacted junctions. The Suns-Voc measurements showed that the bias-dependence of the light I-V curves did not originate from the recombination in the SiO2/Si or a-Si:H(p)/c-Si(n) interface, but from the series resistances. It is possible to explain the bias-dependent light I-V curve in terms of the conductivity of a-Si:H(p) and difference in the electrical contact properties between a-Si:H(p), ZnO and c-Si(n). These results mean that the electrical properties of the a-Si:H(p) layer and the contact properties with this layer are also critical to obtain a high Jsc and fill factor in n-type based Si heterojunction solar cells.
Original language | English |
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Pages (from-to) | 1186-1190 |
Number of pages | 5 |
Journal | Current Applied Physics |
Volume | 9 |
Issue number | 6 |
DOIs | |
Publication status | Published - 2009 Nov |
Keywords
- Heterojunction
- I-V analysis
- Solar cells
- a-Si/c-Si
ASJC Scopus subject areas
- Materials Science(all)
- Physics and Astronomy(all)