Understanding random telegraph noise in two-dimensional BP/ReS2heterointerface

Byung Chul Lee, Youkyung Seo, Chulmin Kim, Yeeun Kim, Min Kyu Joo, Gyu Tae Kim

Research output: Contribution to journalArticlepeer-review

Abstract

Black phosphorus (BP)-based broken gap heterojunctions have attracted significant attention mainly owing to its wide thickness-dependent Fermi level, offering opportunities to demonstrate various carrier transport characteristics and high performing optoelectronic applications. However, the interfacial effects on the carrier scattering mechanism of the two-dimensional (2D) broken gap heterojunctions are unclear. Herein, we discuss the origin of random telegraph noise of multilayer BP/ReS2 heterojunction diode, in particular, at the direct tunneling (DT) conduction regime. The gate-tunable diode characteristic of BP/ReS2 heterojunction allows one to unveil systematically the transition of the charge fluctuation mechanism from drift-diffusion to the DT regime. Unlike individual BP and ReS2 devices, the current noise histogram obtained from the BP/ReS2 heterojunction device exhibits exclusively two dominant peaks at the DT regime. We ascribed this distinct low-frequency noise feature representing the presence of random telegraph signal to the BP/ReS2 interfacial traps by taking into account of the inherent direct tunneling current conduction mechanism. In addition, the electrostatic bias-dependent power spectrum density manifests clearly that the dominant scattering mechanism is the carrier number fluctuation rather than tunneling barrier height fluctuation at the BP/ReS2 heterointerface. This study elucidates the carrier transport and the charge fluctuation mechanism at the 2D heterostructure interface.

Original languageEnglish
Article number253507
JournalApplied Physics Letters
Volume120
Issue number25
DOIs
Publication statusPublished - 2022 Jun 20

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Understanding random telegraph noise in two-dimensional BP/ReS2heterointerface'. Together they form a unique fingerprint.

Cite this