Unidirectional Anisotropy in Exchange Coupled NiFe/FeMn System for Thin NiFe Films

Y. K. Kim, L. L. Rea, K. Ha

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

The unidirectional exchange anisotropy field Hex was investigated in NiFe/FeMn films. It was found that the Hex is proportional to tNiFe−1.2 for 30 Å; ≤ tNiFe ≤ 400 Å where tNiFe is the NiFe film thickness. For tNiFe = 30 Å, Hex was measured to be 800 Oe in some samples. NiFe/FeMn structures on alumina underlayers were also studied; their presence reduces the strength of the anisotropy significantly.

Original languageEnglish
Pages (from-to)3823-3825
Number of pages3
JournalIEEE Transactions on Magnetics
Volume31
Issue number6
DOIs
Publication statusPublished - 1995 Nov
Externally publishedYes

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Fingerprint Dive into the research topics of 'Unidirectional Anisotropy in Exchange Coupled NiFe/FeMn System for Thin NiFe Films'. Together they form a unique fingerprint.

Cite this