Unmatched projectorbackprojector pair for demultiplexing in multipinhole emission computed tomography

Byung Jun Min, Yong Choi, Nam Yong Lee, Jin Ho Jung, Key Jo Hong, Ji Hoon Kang, Wei Hu, Kisung Lee, Young Bok Ahn, Jinhun Joung

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

Statistically based iterative algorithms such as maximum likelihood-expectation maximization (ML-EM) are used for image reconstruction in single photon emission computed tomography (SPECT). Unmatched projectorbackprojector pairs are sometimes used to accelerate the iteration process in the reconstruction algorithm. In this work, we propose and explore the use of an unmatched projectorbackprojector pair for demultiplexing in multipinhole SPECT. Several simulations are conducted to evaluate the performance of the proposed method with uniform, hot-rod, and cold-rod phantoms. The proposed method incorporates an unmatched backprojector to utilize selective multiplexed projection data in reconstruction algorithms, while the projector is modeled as accurately as possible to represent realistic imaging geometry and the physical effects of multipinhole SPECT. The root mean square (rms) error and backprojection speed are evaluated to determine an unmatched backprojector. Our results demonstrate that the proposed method provides high-quality multipinhole SPECT images without multiplexing-related artifacts when a well-chosen unmatched backprojector is used.

Original languageEnglish
Article number127004
JournalOptical Engineering
Volume49
Issue number12
DOIs
Publication statusPublished - 2010 Dec 1

    Fingerprint

Keywords

  • demultiplexing
  • image reconstruction
  • maximum likelihood-expectation maximization
  • multipinhole collimator
  • system matrix
  • tomography

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics
  • Engineering(all)

Cite this

Min, B. J., Choi, Y., Lee, N. Y., Jung, J. H., Hong, K. J., Kang, J. H., ... Joung, J. (2010). Unmatched projectorbackprojector pair for demultiplexing in multipinhole emission computed tomography. Optical Engineering, 49(12), [127004]. https://doi.org/10.1117/1.3518081