Abstract
In recent decades, solution-processable, printable oxide thin-film transistors have garnered a tremendous amount of attention given their potential for use in low-cost, large-area electronics. However, printable metallic source/drain electrodes undergo undesirable electrical/thermal migration at an interfacial stack of the oxide semiconductor and metal electrode. In this study, we report oleic acid-capped Ag nanoparticles that effectively suppress the significant Ag migration and facilitate high field-effect mobilities in oxide transistors. The origin of the role of surface-capped Ag nanoparticles is clarified with comparative studies based on X-ray photoelectron spectroscopy and X-ray absorption spectroscopy.
| Original language | English |
|---|---|
| Pages (from-to) | 14058-14066 |
| Number of pages | 9 |
| Journal | ACS Applied Materials and Interfaces |
| Volume | 9 |
| Issue number | 16 |
| DOIs | |
| Publication status | Published - 2017 Apr 26 |
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Keywords
- Ag
- migration
- solution-process
- transistor
ASJC Scopus subject areas
- Materials Science(all)
Cite this
Unraveling the Issue of Ag Migration in Printable Source/Drain Electrodes Compatible with Versatile Solution-Processed Oxide Semiconductors for Printed Thin-Film Transistor Applications. / Hong, Gyu Ri; Lee, Sun Sook; Park, Hye Jin; Jo, Yejin; Kim, Ju Young; Lee, Hoi Sung; Kang, Yun Chan; Ryu, Beyong Hwan; Song, Aeran; Chung, Kwun Bum; Choi, Youngmin; Jeong, Sunho.
In: ACS Applied Materials and Interfaces, Vol. 9, No. 16, 26.04.2017, p. 14058-14066.Research output: Contribution to journal › Article
}
TY - JOUR
T1 - Unraveling the Issue of Ag Migration in Printable Source/Drain Electrodes Compatible with Versatile Solution-Processed Oxide Semiconductors for Printed Thin-Film Transistor Applications
AU - Hong, Gyu Ri
AU - Lee, Sun Sook
AU - Park, Hye Jin
AU - Jo, Yejin
AU - Kim, Ju Young
AU - Lee, Hoi Sung
AU - Kang, Yun Chan
AU - Ryu, Beyong Hwan
AU - Song, Aeran
AU - Chung, Kwun Bum
AU - Choi, Youngmin
AU - Jeong, Sunho
PY - 2017/4/26
Y1 - 2017/4/26
N2 - In recent decades, solution-processable, printable oxide thin-film transistors have garnered a tremendous amount of attention given their potential for use in low-cost, large-area electronics. However, printable metallic source/drain electrodes undergo undesirable electrical/thermal migration at an interfacial stack of the oxide semiconductor and metal electrode. In this study, we report oleic acid-capped Ag nanoparticles that effectively suppress the significant Ag migration and facilitate high field-effect mobilities in oxide transistors. The origin of the role of surface-capped Ag nanoparticles is clarified with comparative studies based on X-ray photoelectron spectroscopy and X-ray absorption spectroscopy.
AB - In recent decades, solution-processable, printable oxide thin-film transistors have garnered a tremendous amount of attention given their potential for use in low-cost, large-area electronics. However, printable metallic source/drain electrodes undergo undesirable electrical/thermal migration at an interfacial stack of the oxide semiconductor and metal electrode. In this study, we report oleic acid-capped Ag nanoparticles that effectively suppress the significant Ag migration and facilitate high field-effect mobilities in oxide transistors. The origin of the role of surface-capped Ag nanoparticles is clarified with comparative studies based on X-ray photoelectron spectroscopy and X-ray absorption spectroscopy.
KW - Ag
KW - migration
KW - print
KW - solution-process
KW - transistor
UR - http://www.scopus.com/inward/record.url?scp=85018799540&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85018799540&partnerID=8YFLogxK
U2 - 10.1021/acsami.7b00524
DO - 10.1021/acsami.7b00524
M3 - Article
VL - 9
SP - 14058
EP - 14066
JO - ACS applied materials & interfaces
JF - ACS applied materials & interfaces
SN - 1944-8244
IS - 16
ER -