Unraveling the Issue of Ag Migration in Printable Source/Drain Electrodes Compatible with Versatile Solution-Processed Oxide Semiconductors for Printed Thin-Film Transistor Applications

Gyu Ri Hong, Sun Sook Lee, Hye Jin Park, Yejin Jo, Ju Young Kim, Hoi Sung Lee, Yun Chan Kang, Beyong Hwan Ryu, Aeran Song, Kwun Bum Chung, Youngmin Choi, Sunho Jeong

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

In recent decades, solution-processable, printable oxide thin-film transistors have garnered a tremendous amount of attention given their potential for use in low-cost, large-area electronics. However, printable metallic source/drain electrodes undergo undesirable electrical/thermal migration at an interfacial stack of the oxide semiconductor and metal electrode. In this study, we report oleic acid-capped Ag nanoparticles that effectively suppress the significant Ag migration and facilitate high field-effect mobilities in oxide transistors. The origin of the role of surface-capped Ag nanoparticles is clarified with comparative studies based on X-ray photoelectron spectroscopy and X-ray absorption spectroscopy.

Original languageEnglish
Pages (from-to)14058-14066
Number of pages9
JournalACS Applied Materials and Interfaces
Volume9
Issue number16
DOIs
Publication statusPublished - 2017 Apr 26

Fingerprint

Thin film transistors
Nanoparticles
Electrodes
X ray absorption spectroscopy
Oleic acid
Oleic Acid
Oxides
Oxide films
Transistors
Electronic equipment
X ray photoelectron spectroscopy
Metals
Costs
Oxide semiconductors
Hot Temperature

Keywords

  • Ag
  • migration
  • print
  • solution-process
  • transistor

ASJC Scopus subject areas

  • Materials Science(all)

Cite this

Unraveling the Issue of Ag Migration in Printable Source/Drain Electrodes Compatible with Versatile Solution-Processed Oxide Semiconductors for Printed Thin-Film Transistor Applications. / Hong, Gyu Ri; Lee, Sun Sook; Park, Hye Jin; Jo, Yejin; Kim, Ju Young; Lee, Hoi Sung; Kang, Yun Chan; Ryu, Beyong Hwan; Song, Aeran; Chung, Kwun Bum; Choi, Youngmin; Jeong, Sunho.

In: ACS Applied Materials and Interfaces, Vol. 9, No. 16, 26.04.2017, p. 14058-14066.

Research output: Contribution to journalArticle

Hong, Gyu Ri ; Lee, Sun Sook ; Park, Hye Jin ; Jo, Yejin ; Kim, Ju Young ; Lee, Hoi Sung ; Kang, Yun Chan ; Ryu, Beyong Hwan ; Song, Aeran ; Chung, Kwun Bum ; Choi, Youngmin ; Jeong, Sunho. / Unraveling the Issue of Ag Migration in Printable Source/Drain Electrodes Compatible with Versatile Solution-Processed Oxide Semiconductors for Printed Thin-Film Transistor Applications. In: ACS Applied Materials and Interfaces. 2017 ; Vol. 9, No. 16. pp. 14058-14066.
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