Use of dielectrophoresis in a high-yield fabrication of a carbon nanotube tip

June Ki Park, Ji Eun Kim, Chang-Soo Han

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

This paper reports on the development of an atomic force microscope (AFM) tip with single multiwalled carbon nanotube (MWNT). We used an ac electric field, which causes dielectrophoresis (DEP), to align and deposit single MWNT on a metal-coated AFM tip. By dropping an MWNT solution and applying an electric field between the AFM tip and the electrode, we were able to directly assemble one of MWNTs that were dispersed in the diluted solution on the apex of the AFM tip. We investigated the experimental conditions under which the aligning angle of the CNT to the tip's axis varied according to changes in the angle of alignment between the tip and the electrode. We found the experimental condition of 75% success rate to fabricate CNT tips, and we show how the CNT tip compares with a conventional silicon tip with respect to the imaging of 15 nm gold particles.

Original languageEnglish
Pages (from-to)3235-3239
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume44
Issue number5 A
DOIs
Publication statusPublished - 2005 May 1
Externally publishedYes

Fingerprint

Electrophoresis
Multiwalled carbon nanotubes (MWCN)
Carbon nanotubes
Microscopes
carbon nanotubes
Fabrication
fabrication
Electric fields
microscopes
Electrodes
Deposits
Gold
Imaging techniques
Silicon
electrodes
electric fields
Metals
apexes
deposits
alignment

Keywords

  • AFM
  • Alignment angle
  • Carbon nanotube
  • Dielectrophoresis
  • Electric field

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

Cite this

Use of dielectrophoresis in a high-yield fabrication of a carbon nanotube tip. / Park, June Ki; Kim, Ji Eun; Han, Chang-Soo.

In: Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers, Vol. 44, No. 5 A, 01.05.2005, p. 3235-3239.

Research output: Contribution to journalArticle

@article{df3e8477d26048afb982ce7d49d55166,
title = "Use of dielectrophoresis in a high-yield fabrication of a carbon nanotube tip",
abstract = "This paper reports on the development of an atomic force microscope (AFM) tip with single multiwalled carbon nanotube (MWNT). We used an ac electric field, which causes dielectrophoresis (DEP), to align and deposit single MWNT on a metal-coated AFM tip. By dropping an MWNT solution and applying an electric field between the AFM tip and the electrode, we were able to directly assemble one of MWNTs that were dispersed in the diluted solution on the apex of the AFM tip. We investigated the experimental conditions under which the aligning angle of the CNT to the tip's axis varied according to changes in the angle of alignment between the tip and the electrode. We found the experimental condition of 75{\%} success rate to fabricate CNT tips, and we show how the CNT tip compares with a conventional silicon tip with respect to the imaging of 15 nm gold particles.",
keywords = "AFM, Alignment angle, Carbon nanotube, Dielectrophoresis, Electric field",
author = "Park, {June Ki} and Kim, {Ji Eun} and Chang-Soo Han",
year = "2005",
month = "5",
day = "1",
doi = "10.1143/JJAP.44.3235",
language = "English",
volume = "44",
pages = "3235--3239",
journal = "Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes",
issn = "0021-4922",
publisher = "Japan Society of Applied Physics",
number = "5 A",

}

TY - JOUR

T1 - Use of dielectrophoresis in a high-yield fabrication of a carbon nanotube tip

AU - Park, June Ki

AU - Kim, Ji Eun

AU - Han, Chang-Soo

PY - 2005/5/1

Y1 - 2005/5/1

N2 - This paper reports on the development of an atomic force microscope (AFM) tip with single multiwalled carbon nanotube (MWNT). We used an ac electric field, which causes dielectrophoresis (DEP), to align and deposit single MWNT on a metal-coated AFM tip. By dropping an MWNT solution and applying an electric field between the AFM tip and the electrode, we were able to directly assemble one of MWNTs that were dispersed in the diluted solution on the apex of the AFM tip. We investigated the experimental conditions under which the aligning angle of the CNT to the tip's axis varied according to changes in the angle of alignment between the tip and the electrode. We found the experimental condition of 75% success rate to fabricate CNT tips, and we show how the CNT tip compares with a conventional silicon tip with respect to the imaging of 15 nm gold particles.

AB - This paper reports on the development of an atomic force microscope (AFM) tip with single multiwalled carbon nanotube (MWNT). We used an ac electric field, which causes dielectrophoresis (DEP), to align and deposit single MWNT on a metal-coated AFM tip. By dropping an MWNT solution and applying an electric field between the AFM tip and the electrode, we were able to directly assemble one of MWNTs that were dispersed in the diluted solution on the apex of the AFM tip. We investigated the experimental conditions under which the aligning angle of the CNT to the tip's axis varied according to changes in the angle of alignment between the tip and the electrode. We found the experimental condition of 75% success rate to fabricate CNT tips, and we show how the CNT tip compares with a conventional silicon tip with respect to the imaging of 15 nm gold particles.

KW - AFM

KW - Alignment angle

KW - Carbon nanotube

KW - Dielectrophoresis

KW - Electric field

UR - http://www.scopus.com/inward/record.url?scp=22544439341&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=22544439341&partnerID=8YFLogxK

U2 - 10.1143/JJAP.44.3235

DO - 10.1143/JJAP.44.3235

M3 - Article

AN - SCOPUS:22544439341

VL - 44

SP - 3235

EP - 3239

JO - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

JF - Japanese Journal of Applied Physics, Part 1: Regular Papers & Short Notes

SN - 0021-4922

IS - 5 A

ER -