Use of dielectrophoresis in a high-yield fabrication of a carbon nanotube tip

June Ki Park, Ji Eun Kim, Chang Soo Han

Research output: Contribution to journalArticle

9 Citations (Scopus)

Abstract

This paper reports on the development of an atomic force microscope (AFM) tip with single multiwalled carbon nanotube (MWNT). We used an ac electric field, which causes dielectrophoresis (DEP), to align and deposit single MWNT on a metal-coated AFM tip. By dropping an MWNT solution and applying an electric field between the AFM tip and the electrode, we were able to directly assemble one of MWNTs that were dispersed in the diluted solution on the apex of the AFM tip. We investigated the experimental conditions under which the aligning angle of the CNT to the tip's axis varied according to changes in the angle of alignment between the tip and the electrode. We found the experimental condition of 75% success rate to fabricate CNT tips, and we show how the CNT tip compares with a conventional silicon tip with respect to the imaging of 15 nm gold particles.

Original languageEnglish
Pages (from-to)3235-3239
Number of pages5
JournalJapanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers
Volume44
Issue number5 A
DOIs
Publication statusPublished - 2005 May 1

Keywords

  • AFM
  • Alignment angle
  • Carbon nanotube
  • Dielectrophoresis
  • Electric field

ASJC Scopus subject areas

  • Engineering(all)
  • Physics and Astronomy(all)

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