Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube: Experimental investigation

Ji E. Kim, June K. Park, Chang-Soo Han

Research output: Contribution to journalArticle

22 Citations (Scopus)

Abstract

We have developed a method for fabricating a carbon nanotube (CNT) tip for an atomic force microscope (AFM). To attach a CNT to the tip apex, we used dielectrophoresis (DEP) with a non-uniform electric field. After inserting a drop of CNT solution and applying an AC electric field between a metal-coated AFM tip and an electrode plate, CNTs were deposited directly on the tip so that they protruded from the tip. We fabricated tips with individual multi-walled carbon nanotubes and found the experimental conditions that gave high fabrication yields. From AFM measurements of the nanoscale anodized aluminium oxide (AAO) structure, we have shown that a CNT tip assembled using DEP can produce high-resolution images and have a good wear resistance.

Original languageEnglish
Article number019
Pages (from-to)2937-2941
Number of pages5
JournalNanotechnology
Volume17
Issue number12
DOIs
Publication statusPublished - 2006 Jun 28
Externally publishedYes

Fingerprint

Carbon Nanotubes
Electrophoresis
Carbon nanotubes
Microscopes
carbon nanotubes
microscopes
Fabrication
fabrication
Electric fields
Aluminum Oxide
Image resolution
Wear resistance
electric fields
Electrodes
Metals
wear resistance
Aluminum
Oxides
alternating current
apexes

ASJC Scopus subject areas

  • Engineering (miscellaneous)
  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube : Experimental investigation. / Kim, Ji E.; Park, June K.; Han, Chang-Soo.

In: Nanotechnology, Vol. 17, No. 12, 019, 28.06.2006, p. 2937-2941.

Research output: Contribution to journalArticle

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