Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube: Experimental investigation

Ji E. Kim, June K. Park, Chang-Soo Han

Research output: Contribution to journalArticle

22 Citations (Scopus)


We have developed a method for fabricating a carbon nanotube (CNT) tip for an atomic force microscope (AFM). To attach a CNT to the tip apex, we used dielectrophoresis (DEP) with a non-uniform electric field. After inserting a drop of CNT solution and applying an AC electric field between a metal-coated AFM tip and an electrode plate, CNTs were deposited directly on the tip so that they protruded from the tip. We fabricated tips with individual multi-walled carbon nanotubes and found the experimental conditions that gave high fabrication yields. From AFM measurements of the nanoscale anodized aluminium oxide (AAO) structure, we have shown that a CNT tip assembled using DEP can produce high-resolution images and have a good wear resistance.

Original languageEnglish
Article number019
Pages (from-to)2937-2941
Number of pages5
Issue number12
Publication statusPublished - 2006 Jun 28
Externally publishedYes


ASJC Scopus subject areas

  • Engineering (miscellaneous)
  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)

Cite this