Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube

A numerical analysis

Ji E. Kim, Chang-Soo Han

Research output: Contribution to journalArticle

64 Citations (Scopus)

Abstract

To fabricate an atomic force microscope tip with an attached carbon nanotube (CNT), we simulated dielectrophoresis, produced by a nonuniform electric field. We calculated the dielectrophoretic force and torque of CNTs dispersed in a fluid. We then investigated the effect of various parameters such as the initial conditions of the CNT, the distance between the tip and the electrode, and the shape of the tip's apex. Using the results of the simulation, we examined the assembly conditions for achieving a high success rate. In particular, we found that the optimal distance between the tip and the electrode was 10 νm.

Original languageEnglish
Pages (from-to)2245-2250
Number of pages6
JournalNanotechnology
Volume16
Issue number10
DOIs
Publication statusPublished - 2005 Oct 1
Externally publishedYes

Fingerprint

Carbon Nanotubes
Electrophoresis
numerical analysis
Numerical analysis
Carbon nanotubes
Electrodes
Microscopes
carbon nanotubes
microscopes
Fabrication
fabrication
Torque
Electric fields
Fluids
electrodes
torque
apexes
assembly
electric fields
fluids

ASJC Scopus subject areas

  • Engineering (miscellaneous)
  • Materials Science(all)
  • Physics and Astronomy (miscellaneous)

Cite this

Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube : A numerical analysis. / Kim, Ji E.; Han, Chang-Soo.

In: Nanotechnology, Vol. 16, No. 10, 01.10.2005, p. 2245-2250.

Research output: Contribution to journalArticle

@article{97851b8be86544c88d43c837944c855f,
title = "Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube: A numerical analysis",
abstract = "To fabricate an atomic force microscope tip with an attached carbon nanotube (CNT), we simulated dielectrophoresis, produced by a nonuniform electric field. We calculated the dielectrophoretic force and torque of CNTs dispersed in a fluid. We then investigated the effect of various parameters such as the initial conditions of the CNT, the distance between the tip and the electrode, and the shape of the tip's apex. Using the results of the simulation, we examined the assembly conditions for achieving a high success rate. In particular, we found that the optimal distance between the tip and the electrode was 10 νm.",
author = "Kim, {Ji E.} and Chang-Soo Han",
year = "2005",
month = "10",
day = "1",
doi = "10.1088/0957-4484/16/10/046",
language = "English",
volume = "16",
pages = "2245--2250",
journal = "Nanotechnology",
issn = "0957-4484",
publisher = "IOP Publishing Ltd.",
number = "10",

}

TY - JOUR

T1 - Use of dielectrophoresis in the fabrication of an atomic force microscope tip with a carbon nanotube

T2 - A numerical analysis

AU - Kim, Ji E.

AU - Han, Chang-Soo

PY - 2005/10/1

Y1 - 2005/10/1

N2 - To fabricate an atomic force microscope tip with an attached carbon nanotube (CNT), we simulated dielectrophoresis, produced by a nonuniform electric field. We calculated the dielectrophoretic force and torque of CNTs dispersed in a fluid. We then investigated the effect of various parameters such as the initial conditions of the CNT, the distance between the tip and the electrode, and the shape of the tip's apex. Using the results of the simulation, we examined the assembly conditions for achieving a high success rate. In particular, we found that the optimal distance between the tip and the electrode was 10 νm.

AB - To fabricate an atomic force microscope tip with an attached carbon nanotube (CNT), we simulated dielectrophoresis, produced by a nonuniform electric field. We calculated the dielectrophoretic force and torque of CNTs dispersed in a fluid. We then investigated the effect of various parameters such as the initial conditions of the CNT, the distance between the tip and the electrode, and the shape of the tip's apex. Using the results of the simulation, we examined the assembly conditions for achieving a high success rate. In particular, we found that the optimal distance between the tip and the electrode was 10 νm.

UR - http://www.scopus.com/inward/record.url?scp=25444441208&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=25444441208&partnerID=8YFLogxK

U2 - 10.1088/0957-4484/16/10/046

DO - 10.1088/0957-4484/16/10/046

M3 - Article

VL - 16

SP - 2245

EP - 2250

JO - Nanotechnology

JF - Nanotechnology

SN - 0957-4484

IS - 10

ER -