Vacuum null-point scanning thermal microscopy: Simultaneous quantitative nanoscale mapping of undisturbed temperature and thermal resistance

Juhang Cha, Hwijong Shin, Ohmyoung Kwon

Research output: Contribution to journalArticlepeer-review

Abstract

Null-point scanning thermal microscopy (NP SThM) quantitatively measures undisturbed temperature without the influence of changes in physical properties and surface topography of the specimen. Simultaneously NP SThM measures the ratio of the sum of the tip-specimen contact thermal resistance and the spreading thermal resistance of the specimen to the effective thermal resistance of the SThM probe. Hence, arguably, NP SThM is an ideal SThM that meets all the requirements of SThM. However, in practice, the use of NP SThM has been limited to one-dimensional profiling only, and two-dimensional extension of NP SThM has been virtually impossible so far. This is because NP SThM is very difficult to implement and ensure a sufficient measurement sensitivity. In this study, we enable two-dimensional extension of NP SThM with almost a 20-fold improvement in measurement sensitivity even under mild vacuum conditions (<10−3 Torr). Through rigorous analysis of the two-dimensional imaging results of vacuum NP SThM (VNP SThM), we demonstrate the ideal characteristics and performance of VNP SThM. With the ideal measurement characteristics, and the greater sensitivity and convenience, VNP SThM is proven to be an essential tool in the analysis of nanoscale energy transport and conversion occurring inside nanodevices and nanomaterials.

Original languageEnglish
Article number107268
JournalInternational Journal of Thermal Sciences
Volume172
DOIs
Publication statusPublished - 2022 Feb

Keywords

  • Atomic force microscope
  • Null-point scanning thermal microscopy
  • Quantitative measurement
  • Scanning thermal microscopy
  • Thermal resistance
  • Undisturbed temperature

ASJC Scopus subject areas

  • Condensed Matter Physics
  • Engineering(all)

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