Visual analysis of corrupted video data in video event data recorders

Youngbin Pyo, Choongin Lee, Heejo Lee

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

With the rapid proliferation of video event data recorders (VEDRs), video file data from VEDRs are often used as the primary evidence in many fields, such as law enforcement. In this paper, we propose a method for reconstructing corrupted video files and capturing key events recorded in the video file for use as valid evidence. The method first extracts image features from each video frame and constructs a multidimensional vector. Subsequently, dimension reduction of these vectors is performed for visualization in low-dimensional space. The proper sequence of the video frames is restored by using a curve fitting technique for the low-dimensional vectors. Then, we calculate the change in the slope of the curve-fitted model to detect key events in video files. The proposed method generates significant results not provided by existing file recovery techniques.

Original languageEnglish
Title of host publication2017 IEEE Conference on Dependable and Secure Computing
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages453-458
Number of pages6
ISBN (Electronic)9781509055692
DOIs
Publication statusPublished - 2017 Oct 18
Event2017 IEEE Conference on Dependable and Secure Computing - Taipei, Taiwan, Province of China
Duration: 2017 Aug 72017 Aug 10

Other

Other2017 IEEE Conference on Dependable and Secure Computing
CountryTaiwan, Province of China
CityTaipei
Period17/8/717/8/10

Keywords

  • Digital forensics
  • Video event detection
  • Video sequence reconstruction
  • Visualization

ASJC Scopus subject areas

  • Computer Networks and Communications
  • Safety, Risk, Reliability and Quality
  • Software

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  • Cite this

    Pyo, Y., Lee, C., & Lee, H. (2017). Visual analysis of corrupted video data in video event data recorders. In 2017 IEEE Conference on Dependable and Secure Computing (pp. 453-458). [8073828] Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/DESEC.2017.8073828