Visualization of local gate control in a ZnO inter-nanowire junction device

Jin Hyung Lim, Hyun Jin Ji, Goo Eun Jung, Kyung Hoon Chung, Gyu-Tae Kim, Jeong Sook Ha, Ji Yong Park, Se-Jong Kahng

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

Electronic transport behavior of a ZnO inter-nanowire junction transistor was studied with atomic force microscopy (AFM) and scanning gate microscopy. Source-drain currents exhibit strong dependences on gate voltage, applied by a movable local gate. Noticeable local gating was observed when the tip is above the junction area of the inter-nanowire device, demonstrating that active region in the device is confined. Transport mechanism in the device was understood in terms of band bending by electronic doping. Our device structure is analogous to that of two ZnO grains separated by an insulating layer in polycrystalline varistor devices.

Original languageEnglish
Pages (from-to)320-323
Number of pages4
JournalSolid-State Electronics
Volume53
Issue number3
DOIs
Publication statusPublished - 2009 Mar 1

Fingerprint

Nanowires
nanowires
Visualization
Varistors
Drain current
Atomic force microscopy
Microscopic examination
Transistors
Doping (additives)
Scanning
Electric potential
junction transistors
varistors
electronics
atomic force microscopy
microscopy
scanning
electric potential

Keywords

  • Atomic force microscopy
  • Nanowire
  • Scanning gate microscopy

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Condensed Matter Physics
  • Electronic, Optical and Magnetic Materials
  • Materials Chemistry

Cite this

Visualization of local gate control in a ZnO inter-nanowire junction device. / Lim, Jin Hyung; Ji, Hyun Jin; Jung, Goo Eun; Chung, Kyung Hoon; Kim, Gyu-Tae; Ha, Jeong Sook; Park, Ji Yong; Kahng, Se-Jong.

In: Solid-State Electronics, Vol. 53, No. 3, 01.03.2009, p. 320-323.

Research output: Contribution to journalArticle

Lim, Jin Hyung ; Ji, Hyun Jin ; Jung, Goo Eun ; Chung, Kyung Hoon ; Kim, Gyu-Tae ; Ha, Jeong Sook ; Park, Ji Yong ; Kahng, Se-Jong. / Visualization of local gate control in a ZnO inter-nanowire junction device. In: Solid-State Electronics. 2009 ; Vol. 53, No. 3. pp. 320-323.
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