Vulnerability analysis of secure USB flash drives

Hanjae Jeong, Younsung Choi, Woongryel Jeon, Fei Yang, Yunho Lee, Seung-Joo Kim, Dongho Won

Research output: Chapter in Book/Report/Conference proceedingConference contribution

12 Citations (Scopus)

Abstract

USB flash drive without any security function causes the exposure of private information. So new USB flash drive supported security function was invented to compensate for the problem. In this paper, we analyze vulnerability of 6 famous secure USB flash drives, and demonstrate that password can be exposed on communication between the secure USB flash drive and PC. Also we show the vulnerability on the data recovery and the S/W bug of secure USB flash drive.

Original languageEnglish
Title of host publicationRecords of the IEEE International Workshop on Memory Technology, Design and Testing
Pages61-64
Number of pages4
DOIs
Publication statusPublished - 2007 Dec 1
Externally publishedYes
Event17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 - Taipei, Taiwan, Province of China
Duration: 2007 Dec 32007 Dec 5

Other

Other17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007
CountryTaiwan, Province of China
CityTaipei
Period07/12/307/12/5

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Recovery
Communication

ASJC Scopus subject areas

  • Media Technology

Cite this

Jeong, H., Choi, Y., Jeon, W., Yang, F., Lee, Y., Kim, S-J., & Won, D. (2007). Vulnerability analysis of secure USB flash drives. In Records of the IEEE International Workshop on Memory Technology, Design and Testing (pp. 61-64). [4547620] https://doi.org/10.1109/MTDT.2007.4547620

Vulnerability analysis of secure USB flash drives. / Jeong, Hanjae; Choi, Younsung; Jeon, Woongryel; Yang, Fei; Lee, Yunho; Kim, Seung-Joo; Won, Dongho.

Records of the IEEE International Workshop on Memory Technology, Design and Testing. 2007. p. 61-64 4547620.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Jeong, H, Choi, Y, Jeon, W, Yang, F, Lee, Y, Kim, S-J & Won, D 2007, Vulnerability analysis of secure USB flash drives. in Records of the IEEE International Workshop on Memory Technology, Design and Testing., 4547620, pp. 61-64, 17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007, Taipei, Taiwan, Province of China, 07/12/3. https://doi.org/10.1109/MTDT.2007.4547620
Jeong H, Choi Y, Jeon W, Yang F, Lee Y, Kim S-J et al. Vulnerability analysis of secure USB flash drives. In Records of the IEEE International Workshop on Memory Technology, Design and Testing. 2007. p. 61-64. 4547620 https://doi.org/10.1109/MTDT.2007.4547620
Jeong, Hanjae ; Choi, Younsung ; Jeon, Woongryel ; Yang, Fei ; Lee, Yunho ; Kim, Seung-Joo ; Won, Dongho. / Vulnerability analysis of secure USB flash drives. Records of the IEEE International Workshop on Memory Technology, Design and Testing. 2007. pp. 61-64
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