Vulnerability analysis of secure USB flash drives

Hanjae Jeong; Younsung Choi; Woongryel Jeon; Fei Yang; Yunho Lee; Seungjoo Kim; Dongho Won

doi:10.1109/MTDT.2007.4547620

Vulnerability analysis of secure USB flash drives

Hanjae Jeong, Younsung Choi, Woongryel Jeon, Fei Yang, Yunho Lee, Seungjoo Kim, Dongho Won

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

19 Citations (Scopus)

Abstract

USB flash drive without any security function causes the exposure of private information. So new USB flash drive supported security function was invented to compensate for the problem. In this paper, we analyze vulnerability of 6 famous secure USB flash drives, and demonstrate that password can be exposed on communication between the secure USB flash drive and PC. Also we show the vulnerability on the data recovery and the S/W bug of secure USB flash drive.

Original language	English
Title of host publication	17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007
Pages	61-64
Number of pages	4
DOIs	https://doi.org/10.1109/MTDT.2007.4547620
Publication status	Published - 2007
Externally published	Yes
Event	17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007 - Taipei, Taiwan, Province of China Duration: 2007 Dec 3 → 2007 Dec 5

Publication series

Name	Records of the IEEE International Workshop on Memory Technology, Design and Testing
ISSN (Print)	1087-4852

Other

Other	17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007
Country/Territory	Taiwan, Province of China
City	Taipei
Period	07/12/3 → 07/12/5

ASJC Scopus subject areas

Media Technology

Access to Document

10.1109/MTDT.2007.4547620

Cite this

Vulnerability analysis of secure USB flash drives. / Jeong, Hanjae; Choi, Younsung; Jeon, Woongryel et al.

17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007. 2007. p. 61-64 4547620 (Records of the IEEE International Workshop on Memory Technology, Design and Testing).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Jeong, H, Choi, Y, Jeon, W, Yang, F, Lee, Y, Kim, S & Won, D 2007, Vulnerability analysis of secure USB flash drives. in 17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007., 4547620, Records of the IEEE International Workshop on Memory Technology, Design and Testing, pp. 61-64, 17th IEEE International Workshop on Memory Technology, Design, and Testing, MTDT 2007, Taipei, Taiwan, Province of China, 07/12/3. https://doi.org/10.1109/MTDT.2007.4547620

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AU - Won, Dongho

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Vulnerability analysis of secure USB flash drives

Abstract

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ASJC Scopus subject areas

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