Z-contrast scanning transmission electron microscopy on self-assembled CdSe quantum dots in ZnSe and (Zn,Mn)Se matrices

Teya Topuria, Peter Möck, Nigel D. Browning, Lubov V. Titova, Malgorzata Dobrowolska, Sang Hoon Lee, Jacek K. Furdyna

Research output: Chapter in Book/Report/Conference proceedingConference contribution

1 Citation (Scopus)

Abstract

Z-contrast imaging in the scanning transmission electron microscope (STEM) was employed to study single and multi-sheet arrangements of self-assembled CdSe quantum dots (QDs) in ZnSe and (Zn 0.9Mn 0.1)Se matrices. The negligible influence of strain field on Z-contrast images allow for an analysis of the shapes and sizes of a large number of QDs. Higher levels of self-ordering could be proven by such analyses in a sample for which a fractional monolayer of MnSe was deposited prior to the deposition of a single CdSe sheet, that subsequently self-assembled into three dimensional (3D) quantum dots. In the multi-sheet structure, we observed the co-existence of a variety of differently shaped, sized, and self-ordered Cd rich agglomerates. Several of these agglomerates showed different types of compositional modulation on the atomic scale. The advantages of using atomic resolution Z-contrast imaging in STEM for the elucidation of these modulations are demonstrated. Results of the standardless qualitative elemental mapping technique of Z-contrast STEM are in agreement with the results of semi-quantitative energy dispersive X-ray spectroscopy (EDS).

Original languageEnglish
Title of host publicationMaterials Research Society Symposium - Proceedings
EditorsR Leon, R Noetzel, S Fafard, D Huffaker
Volume642
Publication statusPublished - 2001
Externally publishedYes
EventSemiconductor Quantum Dots II - Boston, MA, United States
Duration: 2000 Nov 272000 Nov 30

Other

OtherSemiconductor Quantum Dots II
CountryUnited States
CityBoston, MA
Period00/11/2700/11/30

Fingerprint

Semiconductor quantum dots
Electron microscopes
Transmission electron microscopy
Scanning
Scanning electron microscopy
Modulation
Imaging techniques
Energy dispersive spectroscopy
Monolayers
X-Ray Emission Spectrometry

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials

Cite this

Topuria, T., Möck, P., Browning, N. D., Titova, L. V., Dobrowolska, M., Lee, S. H., & Furdyna, J. K. (2001). Z-contrast scanning transmission electron microscopy on self-assembled CdSe quantum dots in ZnSe and (Zn,Mn)Se matrices. In R. Leon, R. Noetzel, S. Fafard, & D. Huffaker (Eds.), Materials Research Society Symposium - Proceedings (Vol. 642)

Z-contrast scanning transmission electron microscopy on self-assembled CdSe quantum dots in ZnSe and (Zn,Mn)Se matrices. / Topuria, Teya; Möck, Peter; Browning, Nigel D.; Titova, Lubov V.; Dobrowolska, Malgorzata; Lee, Sang Hoon; Furdyna, Jacek K.

Materials Research Society Symposium - Proceedings. ed. / R Leon; R Noetzel; S Fafard; D Huffaker. Vol. 642 2001.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Topuria, T, Möck, P, Browning, ND, Titova, LV, Dobrowolska, M, Lee, SH & Furdyna, JK 2001, Z-contrast scanning transmission electron microscopy on self-assembled CdSe quantum dots in ZnSe and (Zn,Mn)Se matrices. in R Leon, R Noetzel, S Fafard & D Huffaker (eds), Materials Research Society Symposium - Proceedings. vol. 642, Semiconductor Quantum Dots II, Boston, MA, United States, 00/11/27.
Topuria T, Möck P, Browning ND, Titova LV, Dobrowolska M, Lee SH et al. Z-contrast scanning transmission electron microscopy on self-assembled CdSe quantum dots in ZnSe and (Zn,Mn)Se matrices. In Leon R, Noetzel R, Fafard S, Huffaker D, editors, Materials Research Society Symposium - Proceedings. Vol. 642. 2001
Topuria, Teya ; Möck, Peter ; Browning, Nigel D. ; Titova, Lubov V. ; Dobrowolska, Malgorzata ; Lee, Sang Hoon ; Furdyna, Jacek K. / Z-contrast scanning transmission electron microscopy on self-assembled CdSe quantum dots in ZnSe and (Zn,Mn)Se matrices. Materials Research Society Symposium - Proceedings. editor / R Leon ; R Noetzel ; S Fafard ; D Huffaker. Vol. 642 2001.
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AU - Dobrowolska, Malgorzata

AU - Lee, Sang Hoon

AU - Furdyna, Jacek K.

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N2 - Z-contrast imaging in the scanning transmission electron microscope (STEM) was employed to study single and multi-sheet arrangements of self-assembled CdSe quantum dots (QDs) in ZnSe and (Zn 0.9Mn 0.1)Se matrices. The negligible influence of strain field on Z-contrast images allow for an analysis of the shapes and sizes of a large number of QDs. Higher levels of self-ordering could be proven by such analyses in a sample for which a fractional monolayer of MnSe was deposited prior to the deposition of a single CdSe sheet, that subsequently self-assembled into three dimensional (3D) quantum dots. In the multi-sheet structure, we observed the co-existence of a variety of differently shaped, sized, and self-ordered Cd rich agglomerates. Several of these agglomerates showed different types of compositional modulation on the atomic scale. The advantages of using atomic resolution Z-contrast imaging in STEM for the elucidation of these modulations are demonstrated. Results of the standardless qualitative elemental mapping technique of Z-contrast STEM are in agreement with the results of semi-quantitative energy dispersive X-ray spectroscopy (EDS).

AB - Z-contrast imaging in the scanning transmission electron microscope (STEM) was employed to study single and multi-sheet arrangements of self-assembled CdSe quantum dots (QDs) in ZnSe and (Zn 0.9Mn 0.1)Se matrices. The negligible influence of strain field on Z-contrast images allow for an analysis of the shapes and sizes of a large number of QDs. Higher levels of self-ordering could be proven by such analyses in a sample for which a fractional monolayer of MnSe was deposited prior to the deposition of a single CdSe sheet, that subsequently self-assembled into three dimensional (3D) quantum dots. In the multi-sheet structure, we observed the co-existence of a variety of differently shaped, sized, and self-ordered Cd rich agglomerates. Several of these agglomerates showed different types of compositional modulation on the atomic scale. The advantages of using atomic resolution Z-contrast imaging in STEM for the elucidation of these modulations are demonstrated. Results of the standardless qualitative elemental mapping technique of Z-contrast STEM are in agreement with the results of semi-quantitative energy dispersive X-ray spectroscopy (EDS).

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